Wyniki wyszukiwania dla: Fen li
Applied Mathematics and Computation > 2006 > 182 > 1 > 425-433
Pattern Recognition > 2005 > 38 > 1 > 51-58
Pattern Recognition > 2000 > 33 > 2 > 333-340
IEEE Transactions on Reliability > 1984 > R-33 > 3 > 233 - 236