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As the VLSI technologies scale down to the nanometer regime, the circuit design and verification processes have become more and more complex and a reliable operation of VLSI becomes sensitive to the PVT (process, voltage, and temperature) variations. Therefore, the LSI test only before the shipment to screen out the initial failures has been insufficient to ensure the reliable in-field operation of...
In the deep sub-micron technology era, test of VLSI chips becomes much more important in the education of EE department. This paper reports a new trial of VLSI test exercise course in University of Tokyo.
In this paper, we summarize a trial of VLSI CAD education and exercise course with public domain tools. A 2-day course is composed of lectures in auditorium and exercises with workstations and the course is sufficiently useful to the attendees.
Energy consumption is one of the most critical constraints in the current VLSI system designs. In addition, fault tolerance of VLSI systems is also one of the most important requirements in the current shrunk VLSI technologies. This paper presents low power and fault tolerant bus encoding methods considering coupling effects of bus interconnects. Experiments using SPEC2000 benchmark programs show...
Thermodynamic analysis of stress-induced voiding has indicated that a slit-like void is the origin of metal line open failures. Wedge-shaped voids nucleate initially at specific grain boundaries where
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