Search results for: Yongqiang Zhang
International Journal of Circuit Theory and Applications > 50 > 9 > 3279 - 3291
Journal of Electronic Testing > 2018 > 34 > 2 > 109-122
International Journal of Circuit Theory and Applications > 50 > 9 > 3279 - 3291
Journal of Electronic Testing > 2018 > 34 > 2 > 109-122