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The role of the silanization of silicon oxide (SiO x ) with different alkyl-silane molecules, in determining the morphology and structure of the overlying poly(3-hexylthiophene) (P3HT) layer has been studied by atomic force microscopy (AFM) and X-ray diffraction (XRD) techniques. Particular attention has been paid to the first thin layers close to the interface P3HT/SiO x . For each...
An STM-UHV study of the deposition of titanium bis-phthalocyanine under high vacuum (UHV) conditions on two different substrates such as GaAs(100)-β2-(2x4) and highly oriented pyrolytic graphite (HOPG) has been carried out. An STM spectroscopic analysis on the local density of states has been also performed. In the case of GaAs as substrate, the STM images show that the molecules align themselves...
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