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Diagnosis is extremely important to ramp up the yield during the integrated circuit manufacturing process. It reduces the time to market and product cost. Limited observability due to test response compaction negatively affects the diagnosis procedure. When multiple chains, mapped to a single compactor, fail, diagnosis becomes extremely difficult. The procedure is even more complicated because when...
With the increasing complexity of VLSI circuits and systems, their testing is becoming increasingly complex and time consuming. Apart from affecting the design turn-around time, it poses severe challenges to the test engineers in terms of meeting the power-budget and temperature limit of the chip. Power consumption during test is often much higher than in normal mode of operation. Increasing temperature...
The temperature of a block (a region in the chip) depends on both heat generation (caused by power consumption) and heat dissipation among neighbors. Power aware test solutions targeting low power consumption during testing, may not produce an acceptable thermal aware solution. In this paper, a hardware based solution using an AND-OR block between the decompressor and each scan chain, has been utilized...
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