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Diagnosis is extremely important to ramp up the yield during the integrated circuit manufacturing process. It reduces the time to market and product cost. High-volume diagnosis has become crucial for yield learning. The backbone of any diagnosis algorithm is the test set in use. Application of test sets for high-volume testing is typically done in test data compression environment to reduce the test...
Diagnosis is extremely important to ramp up the yield during the integrated circuit manufacturing process. It reduces the time to market and product cost. The back bone of any diagnosis algorithm is the test set in use. In this paper, a novel method has been proposed to increase the diagnosability of a given test set. The proposed method, which takes as input a test set generated for high fault coverage,...
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