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Diagnosis is extremely important to ramp up the yield during the integrated circuit manufacturing process. It reduces the time to market and product cost. Limited observability due to test response compaction negatively affects the diagnosis procedure. When multiple chains, mapped to a single compactor, fail, diagnosis becomes extremely difficult. The procedure is even more complicated because when...
Accuracy of any diagnosis algorithm depends on the test set used. Test that is able to distinguish more fault pairs is better suited for aiding diagnosis. Standard detection test set is generated to detect faults using less number of test patterns. It is unable to distinguish many fault pairs. To distinguish pairs, more patterns are required that consumes ATE memory and time. In this work we devised...
In this paper we present a method to identify don't care locations in a fully specified set of vectors, considering both fault propagation path and fault activation path. We exploit the identified X bits to convert the original vector to low power vector by dictionary based approach to minimize both dynamic and runtime leakage power. The dynamic power as well as the runtime leakage power depends on...
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