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According to the thinner emitting layer and stronger electric field in perovskite light‐emitting diodes (PeLEDs) than those in perovskite solar cells, the strong electric‐field‐driven ion‐migration is a key issue for the operational stability of PeLEDs. Here, a methylene‐bis‐acrylamide cross‐linking strategy is proposed to both passivate defects and suppress ion‐migration with an emphasis on the suppressing...
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