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Dielectric films with a thickness much less than a wavelength pose a challenge in transmission-mode terahertz time-domain spectroscopy (THz-TDS). A small signal change induced by such films is likely to be obscured by system uncertainties. In this abstract, several possible thin-film measurement procedures are carefully considered. It is found that an alternating sample and reference measurement approach...
We show that metamaterials on thin substrates exhibit great sensitivity to changes in their dielectric environment. They thus show excellent potential for sensing applications as the analyte film can be applied on the substrate side.
Using a proton beam based lithography process, we fabricate and study high aspect ratio metamaterials, revealing distinct 3-dimensional resonances. Increased aspect ratio also leads to enhanced tunability and sensitivity for practical applications.
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