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This paper presents the Quick Error Detection (QED) technique for systematically creating families of post-silicon validation tests that quickly detect bugs inside processor cores and uncore components (cache controllers, memory controllers, and on-chip interconnection networks) of multicore system on chips (SoCs). Such quick detection is essential because long error detection latency, the time elapsed...
Virtualization-assisted concurrent, autonomous self-test, or VAST, enables a multi-/many-core system to test itself, concurrently during normal operation, without any user-visible downtime. Such on-line self-test is required for large-scale robust systems with built-in support for circuit failure prediction, failure detection, diagnosis, and self-healing. The main idea behind VAST is hardware and...
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