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Today's mainstream electronic systems typically assume that transistors and interconnects operate correctly over their useful lifetime. With enormous complexity and significantly increased vulnerability to failures compared to the past, future system designs cannot rely on such assumptions. For coming generations of silicon technologies, several causes of hardware reliability failures, largely benign...
Concurrent autonomous self-test, or online self-test, allows a system to test itself, concurrently during normal operation, with no system downtime visible to the end-user. Online self-test is important for overcoming major reliability challenges such as early-life failures and circuit aging in future System-on-Chips (SoCs). To ensure required levels of overall reliability of SoCs, it is essential...
CASP, concurrent autonomous chip self-test using stored test patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any downtime visible to the end-user. CASP consists of two ideas: 1. Storage of very thorough test patterns in non-volatile memory; and, 2. Architectural and system-level support for autonomous testing of one or more cores in...
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