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Effects of trace elements (0.2Y and 0.2Ca (wt%) on the eutectic Ge in high purity Al–20Ge (wt%) alloys were investigated by multi-scale microstructure characterization techniques. Particularly, the distribution of trace elements (Y and Ca) within the eutectic Ge and/or at the interface between eutectic Ge and eutectic Al was investigated by atomic resolution high angle annular dark field scanning...
The microstructures of electroless plated and thermally aged nanocrystalline nickel-3.6 at.% phosphorus layers were investigated on an atomic scale with a tomographic atom probe (TAP). After heat treatments at 250 and 400 o C, a continuous P-segregation in the grain boundaries of the nanocrystalline structure was directly proved for the first time. This segregation effect explains the comparatively...
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