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A shunt resistance on the solar cell edge which is made by an electrostatic discharge (discharge) causes the degradation of multi-junction solar cell (MJ cell). To prevent the degradation, a trench was formed along the edge of multi-junction solar cell (AD MJ cell). The degradation characterization tests were performed on state-of art MJ cell and AD MJ cell to investigate the effect of trench in plasma...
The discharge tests on CIGS arrays were performed in a vacuum chamber which simulates the plasma environment in low Earth orbit and the high-energy electron environment in geostationary orbit. Although no dielectric parts exist on CIGS array, the discharge occurred on the surface and caused cell degradation. The discharge track worked as a leak resistance. To avoid discharge on the surface, it is...
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