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A current probe based on IEC standard 61967-4 is proposed to investigate the conducted electromagnetic emission of IC above 1 GHz. The 1 Ω method in direct coupling method is revisited, and the concern for extending frequency range is discussed. The critical resistive network of 1 Ω probe is realized by a semiconductor process instead of the SMD resistors. With the advantage of reduced parasitic effect,...
A multifunction test board is designed for a microcontroller (MCU) testing. This board can be used to verify the function of the MCU by running several basic instructions. Furthermore, six different IC-EMC measurements complied with IEC standards can be performed on the same board by careful design and the preservation of test points with certified off-board probes. The experimental results show the...
The practical approach to implement a 1 Ω current probe with verification for measuring the IC conducted emission is proposed. The 1 Ω/150 Ω direct coupling method is reviewed and the considerations on improving the applicable bandwidth of 1 Ω method are discussed. The critical component, 1 Ω resistor which dominates the frequency response, is designed. The realized 1 Ω probe was fully certified with...
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