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The ageing kinetics (thermally-induced drift of electrical resistance) in one-, two- and three-layered temperature sensitive thick-film structures based on Cu0,1Ni0,1Co1,6Mn1,2O4 and Cu0,1Ni0,8Co0,2Mn1,9O4 ceramics were investigated. It is established that two processes are activated in the one-layered thick-film elements: burning of organic components between spinel grains and simultaneous penetration...
Structural and electrical properties as well as peculiarities of degradation processes in the Cu- and Ni-enriched thick-film elements based on oxymanganospinel ceramics are investigated. The thermal “shock” effect in the initial stage of isothermal exposure at 170 oC with future stabilization of electrical resistance on this level up to final degradation test was revealed. It is shown that high temperature-sensitivity...
The temperature sensitive thick-film structures in different design of sensitive layers and separate temperature and humidity sensitive thick-film systems based on spinel-type NiMn2O4-CuMn2O4-MnCo2O4 manganites with p- and p+-types of electrical conductivity and insulating magnesium aluminate MgAl2O4 were prepared. Taking into account good properties of obtained elements, they can be applied for microelectronics...
Integrated temperature-humidity-sensitive thick-film structures based on spinel-type semiconducting ceramics of different chemical compositions and magnesium aluminate ceramics were prepared and studied. It is shown that temperature-sensitive thick-film structures possess good electrophysical characteristics in the region from 298 to 358 K. The change of electrical resistance in integrated thick-film...
Temperature-sensitive thick-film systems based on spinel-type NiMn2O4-CuMn2O4-MnCo2O4 manganites with p-and p+-types of electrical conductivity were obtained. All elements are shown good electrophysical characteristics before and after long-term ageing test at 170 °C. It is shown that in two-layer p-p+ systems are typical increases of electrical resistance during ageing test, while three-layer type...
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