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With the use of reference polycrystalline 6h-Al2O3 (NIST SRM- 1976) and MoO3 samples we consider the most significant geometric and physical factors affecting the accuracy of X-ray diffraction data obtained on a diffractometer equipped with a flat two-dimensional detector (Debye-Scherrer scheme). A general strategy to measure polycrystalline samples in the amount of 20–30 fug is proposed. By the example...
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