Search results for: K. Wu
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-3-1 - 4B-3-5
2015 IEEE International Electron Devices Meeting (IEDM) > 7.4.1 - 7.4.4
2015 IEEE International Reliability Physics Symposium > 3A.4.1 - 3A.4.6
IEEE Transactions on Dielectrics and Electrical Insulation > 2014 > 21 > 1 > 5 - 15
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.4.1 - 4A.4.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.3.1 - 5D.3.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 3E.1.1 - 3E.1.5
2012 IEEE International Reliability Physics Symposium (IRPS) > 3B.4.1 - 3B.4.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 5E.3.1 - 5E.3.5
IEEE Transactions on Dielectrics and Electrical Insulation > 2012 > 19 > 1 > 140 - 149
2011 International Reliability Physics Symposium > 6B.1.1 - 6B.1.5
2011 International Reliability Physics Symposium > 5A.3.1 - 5A.3.5
2011 International Reliability Physics Symposium > 2A.4.1 - 2A.4.6
2011 International Reliability Physics Symposium > CP.2.1 - CP.2.6
2010 International Electron Devices Meeting > 35.2.1 - 35.2.4
IEEE Transactions on Dielectrics and Electrical Insulation > 2010 > 17 > 6 > 1796 - 1805