Search results for: J. H. Lee
2016 IEEE International Electron Devices Meeting (IEDM) > 15.2.1 - 15.2.4
International Journal of Automotive Technology > 2016 > 17 > 4 > 671-679
2015 IEEE International Reliability Physics Symposium > PI.1.1 - PI.1.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 3E.1.1 - 3E.1.5