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A general approach for calculating tip–sample capacitance variation in near-field scanning microwave microscopy is presented. It can be applied to arbitrary tip shapes, thick and thin films, and variation due to inhomogeneous perturbation. The computation domain for the tip–sample interaction problem is reduced to a block perturbation area by applying Green’s theorem, and thus it can save substantial...
We present a detailed numerical study of effects that the height of probe and probe ground distance have on the resolution of near field microscopy for dielectric samples. We show the results of contrast capacitance when we change these parameters using a cone sphere tip model in numerical simulation, and discuss how these factors can influence the resolution in microscopy. We propose possible effective...
The main objective of this work is to quantitatively study the extraction problem of distributed parameters of unparallel transmission lines, especially for one specific type of unparallel transmission line model. The infinitesimal transmission lines are equivalent to the parallel transmission lines, and the estimation method of distributed parameters is presented based on the original physical definition...
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