Search results for: Yun Lin
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 241 - 254
IEEE Transactions on Vehicular Technology > 2010 > 59 > 7 > 3634 - 3640
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 241 - 254
IEEE Transactions on Vehicular Technology > 2010 > 59 > 7 > 3634 - 3640