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As technology scales, Negative Bias Temperature Instability (NBTI), which causes temporal performance degradation in digital circuits by affecting PMOS threshold voltage, is emerging as one of the major circuit reliability concerns. In this paper, we first investigate the impact of NBTI on PMOS devices and propose a temporal performance degradation model that considers the temperature variation between...
The TFR (Tampered Failure Rate) model was Proposed by Bhattacharyya and Soejoeti (1989) for step-stress accelerated life tests. This paper point out that the strategy provided in for seeking parameter estimates under normal stresses in step-stress Completely accelerated tests using the usual regression analysis is unreasonable, and offers a method of estimating Parameters under a normal stress. For...
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