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Thin iron oxide layers prepared “in situ” in the ultra high vacuum on polycrystalline iron substrate were investigated by electron spectroscopy methods—X-ray photoelectron spectroscopy (XPS) and elastic peak electron spectroscopy (EPES), using spectrometer ADES-400. The texture and the average grain size of the iron substrate foil have been examined by glancing angle X-ray diffraction (XRD). Qualitative...
Iron oxide of nanometer thickness were grown in situ by step-by-step oxidation of an iron foil to measure the escape probabilities of O 1s photoelectrons as a function of depth of origin, the so-called emission depth distribution function (EDDF), and the mean escape depth (MED). To record photoelectron spectra for a wide range of emission angles, the X-ray excitation source was positioned on the opposite...
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