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Stochastic device noise has become a significant challenge for high-precision analog/RF circuits, and it is particularly difficult to correctly include both white noise and flicker noise in the traditional transient verification with an efficient numerical solution. In this paper, a Non-Monte-Carlo transient noise analysis is developed. Both white noise and flicker noise are considered in Itô integral...
To cope with an increasing complexity when analyzing analog mismatch in sub-90nm designs, this paper presents a fast non-Monte-Carlo method to calculate mismatch in time domain. The local random mismatch is described by a noise source with an explicit dependence on geometric parameters, and is further expanded by stochastic orthogonal polynomials (SOPs). This forms a stochastic differential-algebra-equation...
The design of high-performance analog/RF ICs is challenging and requires numerical efficient design tools. This paper reviews a number of recent research advances in modeling and analysis of high-performance analog/RF ICs. Structured analysis of EM-coupling, non-Monte-Carlo stochastic mismatch analysis, and nonlinear macromodeling for the system-level synthesis are discussed.
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