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Due to outsourcing of IC fabrication, chip supply contamination is a clear and present danger, of which hardware Trojans (HTs) pose the greatest threat. This paper reviews the limitation of existing gate level characterization approaches to HT detection and presents a new detection method with a faster estimation of gate scaling factors by solving the normal equation of linear regression model. The...
This paper presented a RF model of an accumulation-mode MOS varactor for RF applications. Based on this model, simple and continuous equation has been used for describing the characteristics of the device in all operation regions. With a single topology composed of lumped elements, this model can be easily used in commercial circuit simulators. Based on S-parameter measurement, excellent agreement...
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