Search results for: Santosh Biswas
Journal of Electronic Testing > 2019 > 35 > 4 > 441-457
Journal of Electronic Testing > 2019 > 35 > 2 > 215-243
Journal of Electronic Testing > 2018 > 34 > 1 > 83-103
Journal of Electronic Testing > 2017 > 33 > 2 > 227-254
Journal of Electronic Testing > 2005 > 21 > 5 > 503-537