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Single phase multiferroic La0.8Bi0.2Fe0.7Mn0.3O3 thin film is grown successfully on LaNiO3 buffer with LaAlO3 as substrate using RF sputtering. Structural studies show the presence of strain in the thin film with slight expansion in unit cell compared to bulk form. Root mean square (rms) value of surface roughness is ~1.703nm with grain size of ~20nm. Dielectric studies reveal the dispersion behaviour...
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