Search results for: Hee Chul Lee
IEEE Sensors Journal > 2017 > 17 > 20 > 6522 - 6528
IEEE Electron Device Letters > 2009 > 30 > 6 > 635 - 637
IEEE Sensors Journal > 2017 > 17 > 20 > 6522 - 6528
IEEE Electron Device Letters > 2009 > 30 > 6 > 635 - 637