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Scan compression is widely used in high-volume testing of complex integrated circuits. With an increase in design complexity, the increased density of unknown (X) values from output responses reduces compression efficiency. In order to effectively block X values and maximize the effectiveness of test compression, a scan-compression architecture has recently been proposed, in which deterministic test...
Voltage droop is a major reliability concern in nano-scale very large-scale integration designs. Undesirable voltage droop is often a result of excessive IR drop. On the other hand, Ldi/dt-induced droop occurs when logic gates in the circuit draw high-switching current from the on-chip power supply network, and this problem is exacerbated at high-clock frequencies and smaller technology nodes. A consequence...
Voltage droop is a major reliability concern in nano-scale VLSI designs. Undesirable voltage droop occurs when logic gates in the circuit draw high switching current from the on-chip power supply network, and this problem is exacerbated at high clock frequencies and smaller technology nodes. A consequence of voltage droop is an increase in path delays and the occurrence of intermittent faults during...
Advanced machine learning techniques offer an unprecedented opportunity to increase the accuracy of board-level functional fault diagnosis based on the historical data of successfully repaired boards. However, the training complexity increases significantly in diagnosis systems due to the increasing amount of the historical data. We propose a smart learning method in the diagnosis system using incremental...
Fault diagnosis is critical for improving product yield and reducing manufacturing cost. However, it is very challenging to identify the root cause of failures on a complex circuit board. Ambiguous diagnosis results lead to long debug times and even wrong repair actions, which significantly increases the repair cost. We propose an automatic diagnostic system using support vector machines (SVMs). The...
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