Search results for: Javier A. Salcedo
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 772 - 774
IEEE Electron Device Letters > 2013 > 34 > 2 > 178 - 180
IEEE Electron Device Letters > 2011 > 32 > 9 > 1200 - 1202
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 772 - 774
IEEE Electron Device Letters > 2013 > 34 > 2 > 178 - 180
IEEE Electron Device Letters > 2011 > 32 > 9 > 1200 - 1202