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Scanning probe microscopy (SPM) techniques have been developed and deployed to delineate the internal characteristics of electronic and photonic devices such as doping profiles, electric potential profile, electric field profile, and charge carrier profile, as they play a crucial role in the function and performance of biased and unbiased devices. Two of the most promising techniques, scanning spreading...
Scanning voltage microscopy results clearly show that the formation of electric field domains is responsible for the missing of lasing operation in a resonant-phonon based terahertz quantum cascade laser with a highly diagonal transition.
The non-uniform electric field in the active regions of an interband cascade laser is directly imaged and characterized for the first time by employing a nanoscopic voltage profiling technique.
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