Search results for: Yiming Ouyang
Integration, the VLSI Journal > 2018 > 60 > C > 240-247
Engineering Analysis with Boundary Elements > 2017 > 85 > C > 111-115
Microelectronics Journal > 2017 > 61 > C > 43-50
Microelectronics Reliability > 2016 > 63 > C > 239-250
Journal of Network and Computer Applications > 2015 > 53 > Complete > 173-182