Search results for: Yu Jiang
IEEE Communications Magazine > 2017 > 55 > 2 > 201 - 207
Microelectronics Reliability > 2016 > 64 > C > 225-229
IEEE Electron Device Letters > 2009 > 30 > 10 > 1081 - 1083
IEEE Communications Magazine > 2017 > 55 > 2 > 201 - 207
Microelectronics Reliability > 2016 > 64 > C > 225-229
IEEE Electron Device Letters > 2009 > 30 > 10 > 1081 - 1083