Search results for: Eric Beyne
Microelectronics Reliability > 2018 > 87 > C > 97-105
Microelectronics Reliability > 2017 > 79 > C > 297-305
Applied Surface Science > 2017 > 404 > C > 82-87
Microelectronic Engineering > 2017 > 167 > C > 10-16
Microelectronic Engineering > 2016 > 156 > C > 37-40
Microelectronic Engineering > 2015 > 140 > Complete > 72-80
Microelectronics Reliability > 2015 > 55 > 5 > 765-770
Microelectronics Reliability > 2014 > 54 > 9-10 > 1949-1952
Microelectronic Engineering > 2014 > 117 > Complete > 26-34
Microelectronic Engineering > 2013 > 106 > Complete > 155-159
Microelectronics Reliability > 2007 > 47 > 2-3 > 259-265
Nuclear Inst. and Methods in Physics Research, A > 2003 > 509 > 1-3 > 191-199
Microelectronics Reliability > 2003 > 43 > 6 > 913-923
Microelectronics Reliability > 2003 > 43 > 3 > 351-357
Microelectronics Reliability > 2003 > 43 > 2 > 307-318
Microelectronics Journal > 2001 > 32 > 10-11 > 839-846