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In this paper, MLFMA is implemented in the IEFIE to compute scattering from complex conducting structure coated by thin dielectric material. Numerical results demonstrate the efficiency and validity of the present method.
To speed up solution of electromagnetic scattering from 3-D conducting structures coated by thin dielectric material, the multilevel fast multipole algorithm and successive overrelaxation iterative technique are applied into the thin dielectric sheet (TDS) model. Based on the TDS model, only the induced current density on the surface of the conducting structure is required. By adding unitary operator...
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