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In order to characterize dielectric materials having very high permittivity (εr ≈ 40–140) through a non destructive method, and derived from a resonant cavity is proposed and the determination uncertainties are evaluated.
This paper presents a new filter topology using alumina dielectric resonators made by 3D ceramic stereolithography. Thanks to the low loss tangent of the alumina used with this manufacturing process (tan δ= 5 10-5 at 15 GHz), high unloaded quality factor of 6500 could be achieved with this dielectric resonators. The resonators with their brass housing have an unloaded Q factor which is about 35% higher...
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