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In this article, we propose a new dynamic reliability management (DRM) technique for emerging dark silicon manycore processors. We formulate our DRM problem as minimizing the energy consumption subject to the reliability, performance and thermal constraints. The new approach is based on a newly proposed physics-based electromigration (EM) reliability model to predict the EM reliability of full-chip...
In this paper, we propose a new approach for cross-layer electromigration (EM) induced reliability modeling and optimization at physics, system and datacenter levels. We consider a recently proposed physics-based electromigration (EM) reliability model to predict the EM reliability of full-chip power grid networks for long-term failures. We show how the new physics-based dynamic EM model at the physics...
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