The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Using a test structure containing two memory cells with a shared floating gate (FG), we analyzed the processes of hot-electron-induced charge trapping in the FG oxide with a single-trap resolution. Unlike the traditional RTN-based method for single-trap study, the proposed approach allows one to detect not only the interface traps showing capture-emission events in the time domain, but also to resolve...
A new simple and fast method for separation of cycling-induced degradation components in split-gate SuperFlash® cell is proposed. The method is based on the effect of tunneling current stabilization during linearly ramped erase voltage.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.