Search results for: Yu Peng
IEEE Transactions on Instrumentation and Measurement > 2018 > 67 > 1 > 90 - 100
IEEE Access > 2017 > 5 > 19269 - 19281
Measurement > 2017 > 95 > C > 280-292
Microelectronics Reliability > 2016 > 64 > C > 681-687
IEEE Transactions on Instrumentation and Measurement > 2018 > 67 > 1 > 90 - 100
IEEE Access > 2017 > 5 > 19269 - 19281
Measurement > 2017 > 95 > C > 280-292
Microelectronics Reliability > 2016 > 64 > C > 681-687