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We propose InAlAs/InGaAs/InP high electron mobility transistors with an asymmetric chirped dual-grating-gate structure which greatly enhances plasmon instabilities. The fabricated device demonstrates an intense stimulated emission of terahertz monochromatic radiation at cryogenic temperatures for the first time.
We demonstrate an intense stimulated emission of 0.1–1-μW terahertz (THz) monochromatic radiation in InP-based asymmetric chirped dual-grating-gate (AC-DGG) high electron mobility transistors (HEMTs) at 140–290K. In the research of modern THz electronics, development of compact, tunable and coherent sources operating in the THz regime is one of the hottest issues. Hydrodynamic nonlinearities of two-dimensional...
We designed and fabricated InP-based high electron mobility transistors featuring an asymmetric chirped dual-grating-gate structure with a resonant-enhanced photonic vertical cavity. The device structure greatly enhances the Doppler-effect-driven plasma instability, resulting in intense monochromatic superradiant terahertz emission at 3.55 THz at 140K for the first time.
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