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Defect repair has become a necessary process to enhance the overall yield for memories since manufacturing a natural good memory is difficult in current memory technologies. This paper presents an yield-estimation scheme, which utilizes an induction-based approach to calculate the probability that all defects in a memory can be successfully repaired by a two-dimensional redundancy design. Unlike previous...
Based on the non-homogeneity validation method, the hyper-parameter optimization of general regress model on fMRI brain data is analyzed. To acknowledge the abilities of different regression methods we compare ridge regression, support vector regression and Elman recurrent neural network over several feature rating sequences. The original data is obtained from PBAIC2006. Experiment results show that...
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