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Radio-frequency reflectometry (RFR) is a technique that was developed to characterize the properties of transmission lines by observing reflected waveforms. Today, it is widely used in a variety of applications, ranging from the detection of faulty wires in cables and objects buried in the ground to soil moisture detectors and the measurement of dielectric properties of blood. Recently, one important...
We demonstrate a novel dual channel reflectometry technique for identification of charging processes in nanoscale Si single-electron transistors (SETs). By analyzing signals reflected from the drain and the gate of the SET we are able to pinpoint the details of single electron charging in the SET island and in the charged defects nearby.
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