Search results for: Jean-Jacques Hajjar
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-4-1 - EL-4-3
IEEE Electron Device Letters > 2012 > 33 > 11 > 1595 - 1597
IEEE Electron Device Letters > 2012 > 33 > 6 > 860 - 862