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In this paper, a vertical probe card design for wafer-level mobile application processor (AP) chip test is proposed under LPDDR4 channel specifications. The probe card consists of a probe head and a multi-layer ceramic (MLC) board, and it is designed to have signal and power integrity to guarantee the wafer-level AP chips to be operated at 3.2 Gbps of speed under 1.1 V of supply voltage. We proposed...
The output voltage and current from dc-ac inverter generate switching noises and may cause electromagnetic interference (EMI) problems to other electronic systems. To analyze high frequency switching behavior of an inverter accurately, an accurate IGBT model is essential. In this study, an insulated gate bipolar transistor (IGBT) is modeled using datasheet and measurement data to analyze the high...
In this study, an inverter model including non-ideal Insulated Gate Bipolar Transistors (IGBTs) characteristics and a busbar model using impedance measurement is proposed. A motor drive system in Hybrid Electric Vehicle (HEV) consists of a battery, an inverter, a cable, and an electric motor. The inverter is not only a voltage source, but also one of the principal noise sources in the motor drive...
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