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In modern VLSI technology, the occurrence of all kinds of errors has become inevitable. By adopting an emerging concept in VLSI design and test, error tolerance (ET), a novel error-tolerant adder (ETA) is proposed. The ETA is able to ease the strict restriction on accuracy, and at the same time achieve tremendous improvements in both the power consumption and speed performance. When compared to its...
The continuous miniaturization of CMOS feature sizes into the nanometer regime has increasingly caused problems due to noise vulnerability, process variations, and energy consumption. Noise vulnerability and process variations have been recognized to cause statistical or probabilistic device behaviors. In this paper, by capitalizing on what most people termed as nuisance, we demonstrate how noise...
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