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Quiescent leakage current (Iddq) test has proven very effective for detecting defects that escape other test methods, such as small delay faults or reliability hazards. However, leakage currents in microprocessors, digital signal processors, and graphics processors have risen to the point that these products no longer use Iddq test. Quality must be achieved through other test methods, often at higher...
Analysis and comparison of 1.5 mum and 350 nm CMOS test chip results of a built-in current sensor design reveal several critical design issues. This paper includes a discussion of these issues. The success of the sensor design hinges on how these issues are addressed in order to achieve successful operation during technology scaling
A practical built-in current sensor (BICS) is described that senses the voltage drop on supply lines caused by quiescent current leakage. This noninvasive procedure avoids any performance degradation. The sensor performs analog-to-digital conversion of the input signal using a stochastic process, with scan chain readout. Self-calibration and digital chopping are used to minimize offset and low frequency...
A practical built-in current sensor (BICS) design is described in this paper. This sensor system is able to monitor the IDDQ at a resolution level of 10 muA. This system can translate the current level into a digital signal, with scan chain readout. There is no system performance degradation for this sensor and its power dissipation is kept at a very low level. With the help of a self-calibration...
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