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The paper presents a new scan chain selection scheme for response compaction. The proposed solution performs selective masking of scan chains and handles a wide range of unknown state profiles, such that all X states can be eliminated in a per-cycle mode while preserving high observability of scan cells that capture errors.
This paper presents X-Press - a new two-stage test-response compactor that can be easily integrated with a multiple scan-chain environment. This compactor preserves all benefits of spatial compaction and offers, due to its overdrive sequential section, compression much higher than the ratio of scan chains to compactor outputs. X-Press is also capable of handling a wide range of unknown (X) state profiles...
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