Search results for: Seok-Bum Ko
Journal of Electronic Testing > 2004 > 20 > 6 > 661-665
Journal of Electronic Testing > 2004 > 20 > 5 > 489-499
Journal of Systems Architecture > 2002 > 47 > 10 > 831-846
Journal of Electronic Testing > 2004 > 20 > 6 > 661-665
Journal of Electronic Testing > 2004 > 20 > 5 > 489-499
Journal of Systems Architecture > 2002 > 47 > 10 > 831-846