The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The down-scaling of CMOS technologies into the nano-regime and the advent of the Internet of Things (IoT) era jointly conspire to elevate wearout effects to the status of major reliability threats. Bias temperature instability (BTI) and Electromigration (EM) are two of the dominant wearout mechanisms which affect transistors and on-chip interconnect, respectively. Both phenomena have been shown to...
In this paper we propose a cross-layer accelerated self-healing (CLASH) system which “repairs” its wearout issues in a physical sense through accelerated and active recovery, by which wearout can be reversed while actively applying several accelerated self-healing techniques, such as high temperature and negative voltages. Different from previous solutions of coping with wearout issues (e.g. BTI)...
In this paper we postulate that future electronics systems will use sleep time as an active recovery period essential for their overall performance. Our hypothesis is that by explicitly controlling the ratio of sleep vs. active and sleep conditions (e.g. higher temperatures, negative voltages), we can deeply rejuvenate electronic systems periodically to improve their metrics. We perform a series of...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.