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This paper presents Automatic Amplitude Level Regulators (AALR) as a practical Built-In-Test (BIST) and demonstrates its application for on-chip testing and local Calibration of integrated RF blocks. The proposed circuit performs full-wave rectification and generates a dc voltage proportional to the amplitude of an RF signal over a wide frequency range. Both CML and MOS RF AALR are designed and fabricated...
A report is presented on the specific design of a GaN HEMT cascode cell demonstrating significant improvement for flip-chip distributed power amplifiers. The active device is a 8 times 50 mum AlGaN/GaN HEMT grown on SiC substrate. The GaN-based wafer integrating the active part is flip-chipped onto an A1N substrate via electrical and mechanical bumps. The cascode cell integrates matching elements...
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