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A new on-wafer noise parameter measurement method at a 2.8-18-GHz frequency band is presented. This measurement method is based on both temporal and spectral analysis of noise power measurements. We present the method and the experimental results on an active two-port. It requires less equipment than the classic noise parameter measurement method. It gives direct results for 801 points in the 2.8-18-GHz...
The role of the impedance load when dealing with noisy two port networks is investigated. Its value acts directly on input and output return losses (IRL and ORL) that can be simultaneously achieved once input load has been fixed to an arbitrary value. A novel design chart, obtained after examining constant mismatch circles, is introduced, where optimum trade-off between IRL and ORL is promptly identified...
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